Scanning Electron Microscopy and X-Ray Microanalysis

Third Edition

Goldstein, Joseph/Newbury, Dale E/Joy, David C et al
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Bibliografische Daten
ISBN/EAN: 9780306472923
Sprache: Englisch
Umfang: xix, 689 S.
Format (T/L/B): 5 x 26 x 18.5 cm
Auflage: 3. Auflage 2007
Einband: gebundenes Buch

Beschreibung

The text has been used in educating over 3,000 students at the Lehigh SEM short course as well as thousands of undergraduate and graduate students at universities in every corner of the globeThe authors have made extensive changes to the text and figures in this edition as a result of their experience in teaching the various concepts of SEM and x-ray microanalysis